Laser Assisted Mapping and Scanning of SoC on Kria KV260 Vision AI Starter Kit

Mira, Lorenzo

Student Work

Laser Assisted Mapping and Scanning of SoC on Kria KV260 Vision AI Starter Kit

Público Deposited

Multiple scanning and mapping techniques can be used to analyze System-on-Chip architecture of modern field programmable gate arrays. One such method is using contactless optical probing, which allows a user to read physical components within an integrated circuit, allowing for greater insights into their functionality and design integrity. This project shows some of the methods of locating different structural elements within an integrated circuit as well as analyzing the photon emission.

This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

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