To improve the measurement of nanoscale friction, a new alternate method of lateral calibration for the atomic force microscope was examined. This method, which offers the advantage of reduced tip wear, was reviewed and analyzed, and fundamental flaws were identified in its derivation. After modifying this approach, we attempted to confirm our corrected model with a commonly accepted calibration method. The collected data displayed as yet unexplained oscillatory behavior, which showed strong correlations between lateral, drive, and error signals.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• Stevens, Keeley Marin
• DeGraf, Colin J.

Publisher

• Worcester Polytechnic Institute

Identifier

• E-project-042607-101551

Award

• Provost's MQP Award

Advisor

• Burnham, Nancy A.

Year

• 2007

Date created

• 2007-04-26

Resource type

• Major Qualifying Project

Major

• Physics

Rights statement

• In Copyright

最新修改

• 2023-01-20