An atomic force microscope can acquire both topographic and materials-related data, but with cantilevers of different stiffnesses. Unfortunately, changing cantilevers causes the cantilever tip's position over the sample to be lost. By oscillating a single cantilever at an overtone, however, it may be possible to emulate a cantilever of higher stiffness. Using an AFM simulator, I.C. Adams, tests were performed to determine the veracity of this theory. These tests demonstrated that the method has merit, but further experimentation is necessary.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• McCowan, Michael Sturrup

Publisher

• Worcester Polytechnic Institute

Identifier

• 05D075M

Advisor

• Burnham, Nancy A.

Year

• 2005

Date created

• 2005-01-01

Resource type

• Major Qualifying Project

Major

• Computer Science

Rights statement

• In Copyright