Student Work

Photon Emission and Laser-Assisted Side-Channel Analysis of Hardware Implementations

Public Deposited

Photon Emission (PE) and Laser-Assisted Side-Channel Analysis are powerful techniques and essential tools for Integrated Circuit (IC) failure analysis and debugging. Beyond Failure Analysis (FA) applications, cybersecurity research over the past decade has been discovering the capability of these tools to analyze security-based hardware implementations in ICs, like encryption ciphers and key storage locations. This project aims to analyze PE mechanics and identify hardware implementations through PE, show proof of PE-based attacks on commonly used ciphers, and propose countermeasures to mitigate such attacks.

  • This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.
Creator
Publisher
Identifier
  • E-project-042723-142540
  • 106361
Keyword
Advisor
Year
  • 2023
Date created
  • 2023-04-27
Resource type
Major
Source
  • E-project-042723-142540
Rights statement
Last modified
  • 2023-06-23

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