Thin layers of stibnite (Sb2S3) crystals have been analyzed by Fourier-Transform Infrared Spectroscopy (FT-IR). Following this analysis, the surface of the metal was changed by etching the stibnite with various organic compounds. The resulting surface was analyzed with FT-IR again, and compared against the original spectrum. Additionally, the surface was analyzed by X-Ray Photoelectron Spectroscopy (XPS) in order to verify the quality of the stibnite surface and quantify the degree of surface oxidation.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• Hamilton, Brian Richard

Publisher

• Worcester Polytechnic Institute

Identifier

• E-project-043015-134811

Advisor

• Grimm, Ronald

Year

• 2015

Date created

• 2015-04-30

Resource type

• Major Qualifying Project

Major

• Chemistry

Rights statement

• In Copyright

Last modified

• 2020-11-27