Etd
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
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open in viewerThis thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
- Creator
- Colaboradores
- Degree
- Unit
- Publisher
- Language
- English
- Identifier
- etd-042612-131725
- Palavra-chave
- Advisor
- Committee
- Defense date
- Year
- 2012
- Date created
- 2012-04-26
- Resource type
- Rights statement
- Última modificação
- 2021-01-29
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Permanent link to this page: https://digital.wpi.edu/show/cz30ps77f