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- Palavra-chave:
- Surface metrology, Texture, Roughness, Uncertainty, Height difference maps, Multiscale geometric analyses, Area-scale, and Sequential topographic measurements
- O Criador:
- Brown, Christopher A., Kummailil, John, Bergstrom, Torbjorn S., Hamel, Rebecca A., and Gray, Amy R.
- Editor:
- Shaker Verlag
- Data Criada:
- 2004
- Resource Type:
- Conference Proceeding
- O Criador:
- MacDougall, Jonathan Kris., McGowan, Ryan Matthew., Ziemba, Gilead Reed., Hoey, Sean Francis., and Achin, Benjamin Michael.
- Advisor:
- Albano, Leonard D.
- Editor:
- Worcester Polytechnic Institute
- Data Criada:
- 2004-01-01
- Resource Type:
- Major Qualifying Project