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Filtro per: Parola chiave lateral force microscopy

Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

Parola chiave:

analysis, Calibration, curve fitting, Atomic Force Microscopy, friction, force curves, and lateral force microscopy

Creatore:

Anderson, Evan V

Advisor:

Burnham, Nancy A. and Camesano, Terri Anne

Editore:

Worcester Polytechnic Institute

data di creazione:

2012-04-26

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Physics