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Filtragem por: Palavra-chave Sequential topographic measurements

Comparison of surface texture measurement systems

Palavra-chave:

Surface metrology, Texture, Roughness, Uncertainty, Height difference maps, Multiscale geometric analyses, Area-scale, and Sequential topographic measurements

O Criador:

Brown, Christopher A., Kummailil, John, Bergstrom, Torbjorn S., Hamel, Rebecca A., and Gray, Amy R.

Editor:

Shaker Verlag

Data Criada:

2004

Resource Type:

Conference Proceeding