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- Palabra clave:
- Surface metrology, Texture, Roughness, Uncertainty, Height difference maps, Multiscale geometric analyses, Area-scale, and Sequential topographic measurements
- Creador:
- Brown, Christopher A., Kummailil, John, Bergstrom, Torbjorn S., Hamel, Rebecca A., and Gray, Amy R.
- Editor:
- Shaker Verlag
- Fecha de Creacion:
- 2004
- Resource Type:
- Conference Proceeding
