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Filtrado por: Palabra clave PIC Testing

Statistical Variability and Thermal Stability of Photonic Integrated Circuits

Palabra clave:

PIC Thermal Stability, PIC Statistical Stability, PIC Characterization, PIC Testing, Photonic Integrated Circuits, and Small Microring Resonators

Creador:

Kaler, Morgan

Advisor:

Eakin, James and Petkie, Douglas Todd

Editor:

Worcester Polytechnic Institute

Fecha de Creacion:

2022-05-02

Resource Type:

Major Qualifying Project