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Multiscale geometric analyses
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Comparison of surface texture measurement systems
Keyword:
Surface metrology
,
Texture
,
Roughness
,
Uncertainty
,
Height difference maps
,
Multiscale geometric analyses
,
Area-scale
, and
Sequential topographic measurements
Creator:
Brown, Christopher A.
,
Kummailil, John
,
Bergstrom, Torbjorn S.
,
Hamel, Rebecca A.
, and
Gray, Amy R.
Publisher:
Shaker Verlag
Date Created:
2004
Resource Type:
Conference Proceeding
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WPI Faculty Research and Scholarship
1
Year
2004
1
Creator
Bergstrom, Torbjorn S.
1
Brown, Christopher A.
1
Gray, Amy R.
1
Hamel, Rebecca A.
1
Kummailil, John
1
Publisher
Shaker Verlag
1
Resource type
Conference Proceeding
1