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Filtrado por: Palabra clave Atomic force microscopy

Identification and Quantification of Inorganic Nanoparticles in Wastewater

Palabra clave:

Scanning electron microscopy, Wastewater, Nanoparticles, Inductively coupled plasma, Dynamic light scattering, and Atomic force microscopy

Creador:

Chen, Yinduo

Advisor:

Bergendahl, John Andrew

Editor:

Worcester Polytechnic Institute

Fecha de Creacion:

2022-04-29

Resource Type:

Dissertation

Degree:

PhD

Unit (Department):

Civil & Environmental Engineering