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Filtern nach: Unit (Department) Manufacturing Engineering Stichwort Surface Metrology

Stichwort:: Scanning Instruments, Fractal, Anisotropy, Surface, Scanning, and Surface Metrology
Schöpfer:: Bergstrom, Torbjorn S
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2002-01-08
Resource Type:: Thesis
Degree:: MS
Unit (Department):: Manufacturing Engineering

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