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筛选: 创造者 Brown, Christopher A. 关键词 Sequential topographic measurements

Comparison of surface texture measurement systems

关键词:

Surface metrology, Texture, Roughness, Uncertainty, Height difference maps, Multiscale geometric analyses, Area-scale, and Sequential topographic measurements

创造者:

Brown, Christopher A., Kummailil, John, Bergstrom, Torbjorn S., Hamel, Rebecca A., and Gray, Amy R.

出版者:

Shaker Verlag

创建日期:

2004

Resource Type:

Conference Proceeding