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Filtrado por: Creador Anderson, Evan V

Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

Palabra clave:

analysis, Calibration, curve fitting, Atomic Force Microscopy, friction, force curves, and lateral force microscopy

Creador:

Anderson, Evan V

Advisor:

Burnham, Nancy A. and Camesano, Terri Anne

Editor:

Worcester Polytechnic Institute

Fecha de Creacion:

2012-04-26

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Physics