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Filtragem por: Contributor Brown, Christopher A. Palavra-chave Scanning Instruments

Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments

Palavra-chave:

Scanning Instruments, Fractal, Anisotropy, Surface, Scanning, and Surface Metrology

O Criador:

Bergstrom, Torbjorn S

Advisor:

Brown, Christopher A.

Editor:

Worcester Polytechnic Institute

Data Criada:

2002-01-08

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Manufacturing Engineering