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Filtrado por: Advisor Petkie, Douglas Todd Palabra clave PIC Testing

1. Statistical Variability and Thermal Stability of Photonic Integrated Circuits

Palabra clave:: PIC Thermal Stability, PIC Statistical Stability, PIC Characterization, PIC Testing, Photonic Integrated Circuits, and Small Microring Resonators
Creador:: Kaler, Morgan
Advisor:: Eakin, James and Petkie, Douglas Todd
Editor:: Worcester Polytechnic Institute
Fecha de Creacion:: 2022-05-02
Resource Type:: Major Qualifying Project