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Eakin, James
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PIC Testing
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Statistical Variability and Thermal Stability of Photonic Integrated Circuits
Keyword:
PIC Thermal Stability
,
PIC Statistical Stability
,
PIC Characterization
,
PIC Testing
,
Photonic Integrated Circuits
, and
Small Microring Resonators
Creator:
Kaler, Morgan
Advisor:
Eakin, James
and
Petkie, Douglas Todd
Publisher:
Worcester Polytechnic Institute
Date Created:
2022-05-02
Resource Type:
Major Qualifying Project
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2022
1
Creator
Kaler, Morgan
1
Advisor
Eakin, James
[remove]
1
Petkie, Douglas Todd
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Physics
1
Publisher
Worcester Polytechnic Institute
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Resource type
Major Qualifying Project
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