Index Catalog // Hyrax

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Filtern nach: Advisor Brown, Christopher A. Stichwort Surface Metrology

1. Surface Metrology of Impasto

Stichwort:: Interactive, Children, Impasto, Exhibit, Art, and Surface Metrology
Schöpfer:: Fink, Hailey
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2021-07-17
Resource Type:: Interactive Qualifying Project

2. Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments

Stichwort:: Scanning Instruments, Fractal, Anisotropy, Surface, Scanning, and Surface Metrology
Schöpfer:: Bergstrom, Torbjorn S
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2002-01-08
Resource Type:: Thesis
Degree:: MS
Unit (Department):: Manufacturing Engineering